A Bayesian EAP-Based Nonlinear Extension of Croon and Van Veldhoven's Model for Analyzing Data from Micro-Macro Multilevel Designs

dc.contributor.author	Zitzmann, Steffen
dc.contributor.author	Hecht, Martin
dc.date.accessioned	2023-01-12T10:40:29Z
dc.date.available	2023-01-12T10:40:29Z
dc.date.issued	2022
dc.identifier.issn	2227-7390
dc.identifier.uri	http://hdl.handle.net/10900/135204
dc.language.iso	en	de_DE
dc.publisher	Mdpi	de_DE
dc.relation.uri	http://dx.doi.org/10.3390/math10050842	de_DE
dc.subject.ddc	510	de_DE
dc.title	A Bayesian EAP-Based Nonlinear Extension of Croon and Van Veldhoven's Model for Analyzing Data from Micro-Macro Multilevel Designs	de_DE
dc.type	Article	de_DE
utue.quellen.id	20220728000000_01854
utue.personen.roh	Zitzmann, Steffen
utue.personen.roh	Lohmann, Julian F.
utue.personen.roh	Krammer, Georg
utue.personen.roh	Helm, Christoph
utue.personen.roh	Aydin, Burak
utue.personen.roh	Hecht, Martin
dcterms.isPartOf.ZSTitelID	Mathematics	de_DE
dcterms.isPartOf.ZS-Issue	5	de_DE
dcterms.isPartOf.ZS-Volume	10	de_DE
utue.fakultaet	06 Wirtschafts- und sozialwissenschaftliche Fakultät	de_DE