An Accurate Model for the Ion Current-Distance Behavior in Scanning Ion Conductance Microscopy Allows for Calibration of Pipet Tip Geometry and Tip-Sample Distance

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dc.contributor.author Rheinlaender, Johannes
dc.contributor.author Schäffer, Tilman
dc.date.accessioned 2019-04-09T07:59:42Z
dc.date.available 2019-04-09T07:59:42Z
dc.date.issued 2017
dc.identifier.issn 1520-6882
dc.identifier.uri http://hdl.handle.net/10900/87606
dc.language.iso en de_DE
dc.publisher Amer Chemical Soc de_DE
dc.relation.uri http://dx.doi.org/10.1021/acs.analchem.7b03871 de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 540 de_DE
dc.title An Accurate Model for the Ion Current-Distance Behavior in Scanning Ion Conductance Microscopy Allows for Calibration of Pipet Tip Geometry and Tip-Sample Distance de_DE
dc.type Article de_DE
utue.quellen.id 20190131163842_00440
utue.publikation.seiten 11875-11880 de_DE
utue.personen.roh Rheinlaender, Johannes
utue.personen.roh Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID Analytical Chemistry de_DE
dcterms.isPartOf.ZS-Issue 21 de_DE
dcterms.isPartOf.ZS-Volume 89 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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