An Accurate Model for the Ion Current-Distance Behavior in Scanning Ion Conductance Microscopy Allows for Calibration of Pipet Tip Geometry and Tip-Sample Distance

Author:

Rheinlaender, Johannes; Schaeffer, Tilman E.

Tübinger Autor(en):

Published in:

Analytical Chemistry (2017), Bd. 89, H. 21, S. 11875-11880

Verlagsangabe:

Amer Chemical Soc

Language:

English

Full text:

ISSN:

1520-6882

DDC Classifikation:

540 - Chemistry and allied sciences

Dokumentart:

Artikel

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