Quantifying the electrical transport characteristics of electron-doped La0.7Ce0.3MnO3 thin films through hopping energies, Mn valence, and carrier localization length
|
Author:
|
Thiessen, A.; Beyreuther, E.; Werner, R.; Koelle, D.; Kleiner, R.; Eng, L. M.
|
|
Tübinger Autor(en):
|
|
|
Published in:
|
Journal of Physics and Chemistry of Solids
(2015), Bd.
80,
S.
26-33
|
|
Verlagsangabe:
|
Pergamon - Elsevier Science Ltd
|
|
Language:
|
English
|
|
Full text:
|
http://dx.doi.org/10.1016/j.jpcs.2014.12.014
|
|
ISSN:
|
0022-3697
|
|
DDC Classifikation:
|
530 - Physics
|
|
Dokumentart:
|
Artikel
|
|
Show full item record
|
