Quantifying the electrical transport characteristics of electron-doped La0.7Ce0.3MnO3 thin films through hopping energies, Mn valence, and carrier localization length
Author:
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Thiessen, A.; Beyreuther, E.; Werner, R.; Koelle, D.; Kleiner, R.; Eng, L. M.
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Tübinger Autor(en):
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Published in:
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Journal of Physics and Chemistry of Solids
(2015), Bd.
80,
S.
26-33
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Verlagsangabe:
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Pergamon - Elsevier Science Ltd
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Language:
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English
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Full text:
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http://dx.doi.org/10.1016/j.jpcs.2014.12.014
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ISSN:
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0022-3697
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DDC Classifikation:
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530 - Physics
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Dokumentart:
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Artikel
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