Quantifying the electrical transport characteristics of electron-doped La0.7Ce0.3MnO3 thin films through hopping energies, Mn valence, and carrier localization length

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Quantifying the electrical transport characteristics of electron-doped La0.7Ce0.3MnO3 thin films through hopping energies, Mn valence, and carrier localization length

Author: Thiessen, A.; Beyreuther, E.; Werner, R.; Koelle, D.; Kleiner, R.; Eng, L. M.
Tübinger Autor(en):
Werner, Robert
Kölle, Dieter
Kleiner, Reinhold
Published in: Journal of Physics and Chemistry of Solids (2015), Bd. 80, S. 26-33
Verlagsangabe: Pergamon - Elsevier Science Ltd
Language: English
Full text: http://dx.doi.org/10.1016/j.jpcs.2014.12.014
ISSN: 0022-3697
DDC Classifikation: 530 - Physics
Dokumentart: Artikel
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