Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging

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dc.contributor.author Seifert, Jan
dc.contributor.author Rheinlaender, Johannes
dc.contributor.author Schäffer, Tilman
dc.date.accessioned 2015-11-02T15:47:19Z
dc.date.available 2015-11-02T15:47:19Z
dc.date.issued 2015
dc.identifier.issn 0743-7463
dc.identifier.uri http://hdl.handle.net/10900/66077
dc.language.iso en de_DE
dc.publisher Amer Chemical Soc de_DE
dc.relation.uri http://dx.doi.org/10.1021/acs.langmuir.5b01124 de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 540 de_DE
dc.subject.ddc 600 de_DE
dc.title Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging de_DE
dc.type Article de_DE
utue.quellen.id 20150901145020_00329
utue.publikation.seiten 6807-6813 de_DE
utue.personen.roh Seifert, Jan
utue.personen.roh Rheinlaender, Johannes
utue.personen.roh Novak, Pavel
utue.personen.roh Korchev, Yuri E.
utue.personen.roh Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID Langmuir de_DE
dcterms.isPartOf.ZS-Issue 24 de_DE
dcterms.isPartOf.ZS-Volume 31 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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