Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging

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Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging

Author: Seifert, Jan; Rheinlaender, Johannes; Novak, Pavel; Korchev, Yuri E.; Schaeffer, Tilman E.
Tübinger Autor(en):
Seifert, Jan
Rheinlaender, Johannes
Schäffer, Tilman
Published in: Langmuir (2015), Bd. 31, H. 24, S. 6807-6813
Verlagsangabe: Amer Chemical Soc
Language: English
Full text: http://dx.doi.org/10.1021/acs.langmuir.5b01124
ISSN: 0743-7463
DDC Classifikation: 540 - Chemistry and allied sciences
600 - Technology
Dokumentart: Article
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