Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging

Author:

Seifert, Jan; Rheinlaender, Johannes; Novak, Pavel; Korchev, Yuri E.; Schaeffer, Tilman E.

Tübinger Autor(en):

Published in:

Langmuir (2015), Bd. 31, H. 24, S. 6807-6813

Verlagsangabe:

Amer Chemical Soc

Language:

English

Full text:

ISSN:

0743-7463

DDC Classifikation:

540 - Chemistry and allied sciences
600 - Technology

Dokumentart:

Article

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