Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging
Author:
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Seifert, Jan; Rheinlaender, Johannes; Novak, Pavel; Korchev, Yuri E.; Schaeffer, Tilman E.
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Tübinger Autor(en):
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Published in:
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Langmuir
(2015), Bd.
31,
H.
24,
S.
6807-6813
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Verlagsangabe:
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Amer Chemical Soc
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Language:
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English
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Full text:
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http://dx.doi.org/10.1021/acs.langmuir.5b01124
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ISSN:
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0743-7463
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DDC Classifikation:
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540 - Chemistry and allied sciences 600 - Technology
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Dokumentart:
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Article
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Show full item record
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