Cross-Layer Dependability Modeling and Abstraction in System on Chip

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dc.contributor.author Kühn, Johannes Maximilian
dc.contributor.author Rosenstiel, Wolfgang
dc.date.accessioned 2015-05-06T13:55:18Z
dc.date.available 2015-05-06T13:55:18Z
dc.date.issued 2013
dc.identifier.uri http://hdl.handle.net/10900/63218
dc.language.iso en de_DE
dc.relation.uri http://download.lis.ei.tum.de/publications/pub_7028964.pdf de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 004 de_DE
dc.title Cross-Layer Dependability Modeling and Abstraction in System on Chip de_DE
dc.type Artikel de_DE
utue.personen.roh Herkersdorf, Andreas
utue.personen.roh Engel, Michael
utue.personen.roh Henkel, Jörg
utue.personen.roh Glaß, Michael
utue.personen.roh Kleeberger, Veit B.
utue.personen.roh Kochte, Michael A.
utue.personen.roh Kühn, Johannes Maximilian
utue.personen.roh Nassif, Sani R.
utue.personen.roh Rauchfuss, Holm
utue.personen.roh Rosenstiel, Wolfgang
utue.personen.roh Schlichtmann, Ulf
utue.personen.roh Shafique, Mohammad
utue.personen.roh Tahoori, Mehdi B.
utue.personen.roh Teich, Jürgen
utue.personen.roh Wehn, Norbert
utue.personen.roh Weis, Christian
utue.personen.roh Wunderlich, Hans-Joachim
dcterms.isPartOf.ZSTitelID Proceedings of the 9th Workshop on Silicon Errors in Logic - System Effects de_DE
dcterms.isPartOf.ZS-Volume 9 de_DE


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