Cross-Layer Dependability Modeling and Abstraction in System on Chip

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Cross-Layer Dependability Modeling and Abstraction in System on Chip

Author: Herkersdorf, Andreas; Engel, Michael; Henkel, Jörg; Glaß, Michael; Kleeberger, Veit B.; Kochte, Michael A.; Kühn, Johannes Maximilian; Nassif, Sani R.; Rauchfuss, Holm; Rosenstiel, Wolfgang; Schlichtmann, Ulf; Shafique, Mohammad; Tahoori, Mehdi B.; Teich, Jürgen; Wehn, Norbert; Weis, Christian; Wunderlich, Hans-Joachim
Tübinger Autor(en):
Kühn, Johannes Maximilian
Rosenstiel, Wolfgang
Published in: Proceedings of the 9th Workshop on Silicon Errors in Logic - System Effects (2013), Bd. 9
Language: English
Full text: http://download.lis.ei.tum.de/publications/pub_7028964.pdf
DDC Classifikation: 004 - Data processing and computer science
Dokumentart: Artikel
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