Effect of Sample Slope on Image Formation in Scanning Ion Conductance Microscopy

dc.contributor.author	Rheinlaender, Johannes
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2015-02-04T09:58:37Z
dc.date.available	2015-02-04T09:58:37Z
dc.date.issued	2014
dc.identifier.issn	0003-2700
dc.identifier.uri	http://hdl.handle.net/10900/59100
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/ac5024414	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.title	Effect of Sample Slope on Image Formation in Scanning Ion Conductance Microscopy	de_DE
dc.type	Article	de_DE
utue.quellen.id	20150115224006_00507	de_DE
utue.publikation.seiten	9838-9845	de_DE
utue.personen.roh	Thatenhorst, Denis
utue.personen.roh	Rheinlaender, Johannes
utue.personen.roh	Schaeffer, Tilman E.
utue.personen.roh	Dietzel, Irmgard D.
utue.personen.roh	Happel, Patrick
dcterms.isPartOf.ZSTitelID	Analytical Chemistry	de_DE
dcterms.isPartOf.ZS-Issue	19	de_DE
dcterms.isPartOf.ZS-Volume	86	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE