Effect of Sample Slope on Image Formation in Scanning Ion Conductance Microscopy

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Effect of Sample Slope on Image Formation in Scanning Ion Conductance Microscopy

Author: Thatenhorst, Denis; Rheinlaender, Johannes; Schaeffer, Tilman E.; Dietzel, Irmgard D.; Happel, Patrick
Tübinger Autor(en):
Rheinlaender, Johannes
Schäffer, Tilman
Published in: Analytical Chemistry (2014), Bd. 86, H. 19, S. 9838-9845
Verlagsangabe: Amer Chemical Soc
Language: English
Full text: http://dx.doi.org/10.1021/ac5024414
ISSN: 0003-2700
DDC Classifikation: 530 - Physics
Dokumentart: Artikel
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