X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

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dc.contributor.author Kleiner, Reinhold
dc.contributor.author Kölle, Dieter
dc.contributor.author Chassé, Thomas
dc.contributor.author Glaser, Mathias
dc.contributor.author Werner, Robert
dc.contributor.author Raisch, Christoph Werner
dc.date.accessioned 2013-07-17T15:14:36Z
dc.date.available 2013-07-17T15:14:36Z
dc.date.issued 2013
dc.identifier.issn 0021-8979
dc.identifier.uri http://hdl.handle.net/10900/36059
dc.language.iso en de_DE
dc.publisher Amer Inst Physics de_DE
dc.relation.uri http://dx.doi.org/10.1063/1.4789988
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 530 de_DE
dc.title X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films de_DE
dc.type Artikel de_DE
utue.quellen.id 20130315161744_00049 de_DE
utue.personen.roh Raisch, C.
utue.personen.roh Langheinrich, C.
utue.personen.roh Werner, R.
utue.personen.roh Kleiner, R.
utue.personen.roh Koelle, D.
utue.personen.roh Glaser, M.
utue.personen.roh Chasse, T.
utue.personen.roh Chasse, A.
dcterms.isPartOf.ZSTitelID Journal of Applied Physics de_DE
dcterms.isPartOf.ZS-Issue Article 063511 de_DE
dcterms.isPartOf.ZS-Volume 113 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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