X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

Author:

Raisch, C.; Langheinrich, C.; Werner, R.; Kleiner, R.; Koelle, D.; Glaser, M.; Chasse, T.; Chasse, A.

Tübinger Autor(en):

Published in:

Journal of Applied Physics (2013), Bd. 113, Article 063511

Verlagsangabe:

Amer Inst Physics

Language:

English

Full text:

ISSN:

0021-8979

DDC Classifikation:

530 - Physics

Dokumentart:

Article

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