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| dc.contributor.author | Al Ktash, Mohammad | |
| dc.contributor.author | Stefanakis, Mona | |
| dc.contributor.author | Brecht, Marc | |
| dc.date.accessioned | 2022-06-29T07:44:37Z | |
| dc.date.available | 2022-06-29T07:44:37Z | |
| dc.date.issued | 2021 | |
| dc.identifier.issn | 1424-8220 | |
| dc.identifier.uri | http://hdl.handle.net/10900/128611 | |
| dc.language.iso | en | de_DE |
| dc.publisher | Basel | de_DE |
| dc.relation.uri | http://dx.doi.org/10.3390/s21217332 | de_DE |
| dc.subject.ddc | 540 | de_DE |
| dc.subject.ddc | 600 | de_DE |
| dc.title | UV Hyperspectral Imaging as Process Analytical Tool for the Characterization of Oxide Layers and Copper States on Direct Bonded Copper | de_DE |
| dc.type | Article | de_DE |
| utue.quellen.id | 20220404000000_00650 | |
| utue.personen.roh | Al Ktash, Mohammad | |
| utue.personen.roh | Stefanakis, Mona | |
| utue.personen.roh | Englert, Tim | |
| utue.personen.roh | Drechsel, Maryam S. L. | |
| utue.personen.roh | Stiedl, Jan | |
| utue.personen.roh | Green, Simon | |
| utue.personen.roh | Jacob, Timo | |
| utue.personen.roh | Boldrini, Barbara | |
| utue.personen.roh | Ostertag, Edwin | |
| utue.personen.roh | Rebner, Karsten | |
| utue.personen.roh | Brecht, Marc | |
| dcterms.isPartOf.ZSTitelID | Sensors | de_DE |
| dcterms.isPartOf.ZS-Issue | 21 | de_DE |
| dcterms.isPartOf.ZS-Volume | 21 | de_DE |
| utue.fakultaet | 07 Mathematisch-Naturwissenschaftliche Fakultät | de_DE |
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