Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly

dc.contributor.author	Akata, Zeynep
dc.date.accessioned	2020-05-18T14:07:49Z
dc.date.available	2020-05-18T14:07:49Z
dc.date.issued	2019-07-19
dc.identifier.uri	http://hdl.handle.net/10900/100758
dc.language.iso	en	de_DE
dc.relation.uri	http://dx.doi.org/10.1109/TPAMI.2018.2857768	de_DE
dc.subject.ddc	004	de_DE
dc.title	Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly	de_DE
dc.type	Article	de_DE
utue.publikation.seiten	2251 - 2265	de_DE
utue.personen.roh	Xian, Yongqin
utue.personen.roh	Lampert, Christoph
utue.personen.roh	Schiele, Bernt
utue.personen.roh	Akata, Zeynep
dcterms.isPartOf.ZSTitelID	IEEE Transactions on Pattern Analysis and Machine Intelligence	de_DE
dcterms.isPartOf.ZS-Volume	41	de_DE