Advanced optical quality assurance of silicon micro-strip sensors for the CBM Silicon Tracking System

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Advanced optical quality assurance of silicon micro-strip sensors for the CBM Silicon Tracking System

Author: Lavrik, E.
Tübinger Autor(en):
Lavrik, Evgeny
Published in: Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment (2019), Bd. 936, S. 640-641
Verlagsangabe: Elsevier Science Bv
Language: English
Full text: http://dx.doi.org/10.1016/j.nima.2018.09.131
ISSN: 1872-9576
DDC Classifikation: 600 - Technology
530 - Physics
Dokumentart: Article
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