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| dc.contributor.author | Schwarz, Heinz | |
| dc.date.accessioned | 2020-03-09T06:59:21Z | |
| dc.date.available | 2020-03-09T06:59:21Z | |
| dc.date.issued | 2019 | |
| dc.identifier.issn | 1361-6463 | |
| dc.identifier.uri | http://hdl.handle.net/10900/98755 | |
| dc.language.iso | en | de_DE |
| dc.publisher | Iop Publishing Ltd | de_DE |
| dc.relation.uri | http://dx.doi.org/10.1088/1361-6463/ab2b31 | de_DE |
| dc.subject.ddc | 530 | de_DE |
| dc.title | Correlative STED super-resolution light and electron microscopy on resin sections | de_DE |
| dc.type | Article | de_DE |
| utue.quellen.id | 20190926111821_00041 | |
| utue.personen.roh | Wurm, Christian A. | |
| utue.personen.roh | Schwarz, Heinz | |
| utue.personen.roh | Jans, Daniel C. | |
| utue.personen.roh | Riedel, Dietmar | |
| utue.personen.roh | Humbel, Bruno M. | |
| utue.personen.roh | Jakobs, Stefan | |
| dcterms.isPartOf.ZSTitelID | Journal of Physics D - Applied Physics | de_DE |
| dcterms.isPartOf.ZS-Issue | Article 374003 | de_DE |
| dcterms.isPartOf.ZS-Volume | 52 | de_DE |
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