Macro-SICM : A Scanning Ion Conductance Microscope for Large-Range Imaging

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Macro-SICM : A Scanning Ion Conductance Microscope for Large-Range Imaging

Author: Schierbaum, Nicolas; Hack, Martin; Betz, Oliver; Schaeffer, Tilman E.
Tübinger Autor(en):
Schierbaum, Nicolas
Hack, Martin
Betz, Oliver
Schäffer, Tilman
Published in: Analytical Chemistry (2018), Bd. 90, H. 8, S. 5048-5054
Verlagsangabe: Amer Chemical Soc
Language: English
Full text: http://dx.doi.org/10.1021/acs.analchem.7b04764
ISSN: 1520-6882
DDC Classifikation: 540 - Chemistry and allied sciences
Dokumentart: Artikel
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