A high-resolution combined scanning laser and widefield polarizing microscope for imaging at temperatures from 4 K to 300 K

Author:

Lange, M.; Guenon, S.; Lever, F.; Kleiner, R.; Koelle, D.

Tübinger Autor(en):

Published in:

Review of Scientific Instruments (2017), Bd. 88, Article 123705

Verlagsangabe:

Amer Inst Physics

Language:

English

Full text:

ISSN:

1089-7623

DDC Classifikation:

530 - Physics
600 - Technology

Dokumentart:

Article

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