In situ synchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon

Author:

Guha, Puspendu; Juluri, Raghavendra Rao; Bhukta, Anjan; Ghosh, Arnab; Maiti, Santanu; Bhattacharyya, Arpan; Srihari, Velaga; Satyam, Parlapalli V.

Tübinger Autor(en):

Published in:

Crystengcomm (2017), Bd. 19, H. 45, S. 6811-6820

Verlagsangabe:

Royal Soc Chemistry

Language:

English

Full text:

ISSN:

1466-8033

DDC Classifikation:

530 - Physics
540 - Chemistry and allied sciences

Dokumentart:

Artikel

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