In situ synchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon

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In situ synchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon

Author: Guha, Puspendu; Juluri, Raghavendra Rao; Bhukta, Anjan; Ghosh, Arnab; Maiti, Santanu; Bhattacharyya, Arpan; Srihari, Velaga; Satyam, Parlapalli V.
Tübinger Autor(en):
Maiti, Santanu
Published in: Crystengcomm (2017), Bd. 19, H. 45, S. 6811-6820
Verlagsangabe: Royal Soc Chemistry
Language: English
Full text: http://dx.doi.org/10.1039/c7ce01441d
ISSN: 1466-8033
DDC Classifikation: 530 - Physics
540 - Chemistry and allied sciences
Dokumentart: Article
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