Lateral Resolution and Image Formation in Scanning Ion Conductance Microscopy

dc.contributor.author	Rheinlaender, Johannes
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2015-10-15T11:16:38Z
dc.date.available	2015-10-15T11:16:38Z
dc.date.issued	2015
dc.identifier.issn	0003-2700
dc.identifier.uri	http://hdl.handle.net/10900/65577
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acs.analchem.5b00900	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	540	de_DE
dc.title	Lateral Resolution and Image Formation in Scanning Ion Conductance Microscopy	de_DE
dc.type	Article	de_DE
utue.quellen.id	20150901145020_00124
utue.publikation.seiten	7117-7124	de_DE
utue.personen.roh	Rheinlaender, Johannes
utue.personen.roh	Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID	Analytical Chemistry	de_DE
dcterms.isPartOf.ZS-Issue	14	de_DE
dcterms.isPartOf.ZS-Volume	87	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE

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