Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy

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dc.contributor.author Raisch, Christoph Werner
dc.contributor.author Werner, Robert
dc.contributor.author Kleiner, Reinhold
dc.contributor.author Kölle, Dieter
dc.date.accessioned 2014-11-05T15:12:40Z
dc.date.available 2014-11-05T15:12:40Z
dc.date.issued 2014
dc.identifier.issn 1098-0121
dc.identifier.uri http://hdl.handle.net/10900/57663
dc.language.iso en de_DE
dc.publisher Amer Physical Soc de_DE
dc.relation.uri http://dx.doi.org/10.1103/PhysRevB.90.125120 de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 530 de_DE
dc.title Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy de_DE
dc.type Artikel de_DE
utue.quellen.id 20141022002833_00081 de_DE
utue.personen.roh Ruosi, A.
utue.personen.roh Raisch, C.
utue.personen.roh Verna, A.
utue.personen.roh Werner, R.
utue.personen.roh Davidson, B. A.
utue.personen.roh Fujii, J.
utue.personen.roh Kleiner, R.
utue.personen.roh Koelle, D.
dcterms.isPartOf.ZSTitelID Physical Review B de_DE
dcterms.isPartOf.ZS-Issue Article 125120 de_DE
dcterms.isPartOf.ZS-Volume 90 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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