Charge granularity in single electron transistors with polysilicon gates

dc.contributor.author	Kotekar-Patil, Dharmraj
dc.contributor.author	Jauerneck, Stefan
dc.contributor.author	Ruoff, Matthias
dc.contributor.author	Wharam, David A.
dc.contributor.author	Kern, Dieter P.
dc.date.accessioned	2014-06-04T14:58:15Z
dc.date.available	2014-06-04T14:58:15Z
dc.date.issued	2012
dc.identifier.isbn	978-1-4673-0191-6
dc.identifier.isbn	978-1-4673-0190-9
dc.identifier.uri	http://hdl.handle.net/10900/53542
dc.language.iso	en	de_DE
dc.publisher	New York, NY : IEEE	de_DE
dc.relation.uri	http://dx.doi.org/10.1109/ULIS.2012.6193364	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.title	Charge granularity in single electron transistors with polysilicon gates	de_DE
dc.type	BookPart	de_DE
utue.publikation.seiten	(89-92)	de_DE
utue.personen.roh	Kotekar-Patil, Dharmraj
utue.personen.roh	Jauerneck, Stefan
utue.personen.roh	Ruoff, Matthias
utue.personen.roh	Wharam, David A.
utue.personen.roh	Kern, Dieter P.
utue.personen.roh	Jehl, X.
utue.personen.roh	Wacquez, R.
utue.personen.roh	Sanquer, M.
utue.publikation.buchdesbeitrags	Proceedings of the 13th International Conference on Ultimate Integration on Silicon (ULIS), 2012	de_DE