Effects of Annealing on Electrode/MoS2 Interfaces Studied by Photoelectron Spectroscopy

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Effects of Annealing on Electrode/MoS2 Interfaces Studied by Photoelectron Spectroscopy

Author: Juriatti, Eric; Spaeth, Christoph; Peisert, Heiko; Scheele, Marcus
Tübinger Autor(en):
Juriatti, Eric
Peisert, Heiko
Scheele, Marcus
Späth, Christoph
Published in: Acs Applied Electronic Materials (2025), Bd. 7, H. 14, S. 6484-6490
Verlagsangabe: Washington : Amer Chemical Soc
Language: English
Full text: http://dx.doi.org/10.1021/acsaelm.5c00799
ISSN: 2637-6113
DDC Classifikation: 600 - Technology
Dokumentart: Article
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