A Hardware-Assisted Approach for Non-Invasive and Fine-Grained Memory Power Management in MCUs
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Author:
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Kuhn, Michael; Schmid, Patrick; Bringmann, Oliver
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Tübinger Autor(en):
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Published in:
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2025 Design, Automation & Test in Europe Conference (DATE)
(2025-05-21), Bd.
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Verlagsangabe:
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IEEE
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Language:
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English
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Full text:
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https://doi.org/10.23919/DATE64628.2025.10993006
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ISSN:
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1558-1101
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ISBN:
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978-3-9826741-0-0
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DDC Classifikation:
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004 - Data processing and computer science
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Dokumentart:
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Article
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