Measuring the Shape, Stiffness, and Interface Tension of Droplets with the Scanning Ion Conductance Microscope

dc.contributor.author	Rheinlaender, Johannes
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2025-07-21T07:26:58Z
dc.date.available	2025-07-21T07:26:58Z
dc.date.issued	2024
dc.identifier.issn	1936-0851
dc.identifier.uri	http://hdl.handle.net/10900/168230
dc.language.iso	en	de_DE
dc.publisher	Washington : Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acsnano.4c02743	de_DE
dc.subject.ddc	540	de_DE
dc.subject.ddc	600	de_DE
dc.title	Measuring the Shape, Stiffness, and Interface Tension of Droplets with the Scanning Ion Conductance Microscope	de_DE
dc.type	Article	de_DE
utue.quellen.id	20241001000000_01135
utue.publikation.seiten	16257-16264	de_DE
utue.personen.roh	Rheinlaender, Johannes
utue.personen.roh	Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID	Acs Nano	de_DE
dcterms.isPartOf.ZS-Issue	25	de_DE
dcterms.isPartOf.ZS-Volume	18	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE