Identification of Fine-grained Systematic Errors via Controlled Scene Generation

dc.contributor.author	Hein, Matthias
dc.date.accessioned	2024-05-27T09:44:08Z
dc.date.available	2024-05-27T09:44:08Z
dc.date.issued	2024-04-10
dc.identifier.uri	http://hdl.handle.net/10900/153706
dc.language.iso	en	de_DE
dc.publisher	arXiv	de_DE
dc.relation.uri	https://doi.org/10.48550/arXiv.2404.07045	de_DE
dc.subject.ddc	004	de_DE
dc.title	Identification of Fine-grained Systematic Errors via Controlled Scene Generation	de_DE
dc.type	Preprint	de_DE
utue.personen.roh	Hein, Matthias
utue.personen.roh	Metzen, Jan Hendrik
utue.personen.roh	Boreiko, Valentyn