Nanoimaging of Orientational Defects in Semiconducting Organic Films

dc.contributor.author	Schreiber, Frank
dc.date.accessioned	2021-11-08T10:26:10Z
dc.date.available	2021-11-08T10:26:10Z
dc.date.issued	2021
dc.identifier.issn	1932-7455
dc.identifier.uri	http://hdl.handle.net/10900/120534
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acs.jpcc.1c00059	de_DE
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.title	Nanoimaging of Orientational Defects in Semiconducting Organic Films	de_DE
dc.type	Article	de_DE
utue.quellen.id	20210824232002_01258
utue.publikation.seiten	9229-9235	de_DE
utue.personen.roh	Mrkyvkova, Nada
utue.personen.roh	Cernescu, Adrian
utue.personen.roh	Futera, Zdenek
utue.personen.roh	Nebojsa, Alois
utue.personen.roh	Dubroka, Adam
utue.personen.roh	Sojkova, Michaela
utue.personen.roh	Hulman, Martin
utue.personen.roh	Majkova, Eva
utue.personen.roh	Jergel, Matej
utue.personen.roh	Siffalovic, Peter
utue.personen.roh	Schreiber, Frank
dcterms.isPartOf.ZSTitelID	Journal of Physical Chemistry C	de_DE
dcterms.isPartOf.ZS-Issue	SI	de_DE
dcterms.isPartOf.ZS-Volume	125	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE