Rayleigh analysis and dielectric dispersion in polycrystalline 0.5(Ba0.7Ca0.3)TiO3-0.5Ba(Zr0.2Ti0.8)O-3 ferroelectric thin films by domain-wall pinning element modeling

Becker, M.; Burkhardt, C. J.; Schroeppel, B.; Kleiner, R.; Koelle, D.

dc.contributor.author	Becker, Mark
dc.contributor.author	Burkhardt, Claus
dc.contributor.author	Schröppel, Birgit
dc.contributor.author	Kleiner, Reinhold
dc.contributor.author	Kölle, Dieter
dc.date.accessioned	2021-05-10T05:33:10Z
dc.date.available	2021-05-10T05:33:10Z
dc.date.issued	2020
dc.identifier.issn	1089-7550
dc.identifier.uri	http://hdl.handle.net/10900/115128
dc.language.iso	en	de_DE
dc.publisher	Amer Inst Physics	de_DE
dc.relation.uri	http://dx.doi.org/10.1063/5.0025109	de_DE
dc.subject.ddc	530	de_DE
dc.title	Rayleigh analysis and dielectric dispersion in polycrystalline 0.5(Ba0.7Ca0.3)TiO3-0.5Ba(Zr0.2Ti0.8)O-3 ferroelectric thin films by domain-wall pinning element modeling	de_DE
dc.type	Article	de_DE
utue.quellen.id	20210304112512_00978
utue.personen.roh	Becker, M.
utue.personen.roh	Burkhardt, C. J.
utue.personen.roh	Schroeppel, B.
utue.personen.roh	Kleiner, R.
utue.personen.roh	Koelle, D.
dcterms.isPartOf.ZSTitelID	Journal of Applied Physics	de_DE
dcterms.isPartOf.ZS-Issue	Article 154103	de_DE
dcterms.isPartOf.ZS-Volume	128 (15)	de_DE
utue.fakultaet	04 Medizinische Fakultät	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE