Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy
Author:
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van den Berg, Marius; Moeinian, Ardeshir; Kobald, Arne; Chen, Yu-Ting; Horneber, Anke; Strehle, Steffen; Meixner, Alfred J.; Zhang, Dai
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Tübinger Autor(en):
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Published in:
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Beilstein Journal of Nanotechnology
(2020), Bd.
11,
S.
1147-1156
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Verlagsangabe:
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Beilstein - Institut
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Language:
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English
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Full text:
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http://dx.doi.org/10.3762/bjnano.11.99
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ISSN:
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2190-4286
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DDC Classifikation:
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530 - Physics 600 - Technology
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Dokumentart:
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Article
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