Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy

Author:

van den Berg, Marius; Moeinian, Ardeshir; Kobald, Arne; Chen, Yu-Ting; Horneber, Anke; Strehle, Steffen; Meixner, Alfred J.; Zhang, Dai

Tübinger Autor(en):

Published in:

Beilstein Journal of Nanotechnology (2020), Bd. 11, S. 1147-1156

Verlagsangabe:

Beilstein - Institut

Language:

English

Full text:

ISSN:

2190-4286

DDC Classifikation:

530 - Physics
600 - Technology

Dokumentart:

Article

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