Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators

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dc.contributor.author Ferdinand, Benedikt
dc.contributor.author Kleiner, Reinhold
dc.contributor.author Kölle, Dieter
dc.date.accessioned 2020-07-16T14:45:32Z
dc.date.available 2020-07-16T14:45:32Z
dc.date.issued 2019
dc.identifier.issn 1089-7623
dc.identifier.uri http://hdl.handle.net/10900/103353
dc.language.iso en de_DE
dc.publisher Amer Inst Physics de_DE
dc.relation.uri http://dx.doi.org/10.1063/1.5116904 de_DE
dc.subject.ddc 530 de_DE
dc.subject.ddc 600 de_DE
dc.title Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators de_DE
dc.type Article de_DE
utue.quellen.id 20200409032300_00594
utue.personen.roh Ebensperger, Nikolaj G.
utue.personen.roh Ferdinand, Benedikt
utue.personen.roh Koelle, Dieter
utue.personen.roh Kleiner, Reinhold
utue.personen.roh Dressel, Martin
utue.personen.roh Scheffler, Marc
dcterms.isPartOf.ZSTitelID Review of Scientific Instruments de_DE
dcterms.isPartOf.ZS-Issue Article 114701 de_DE
dcterms.isPartOf.ZS-Volume 90 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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