Advanced methods for the optical quality assurance of silicon sensors

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Advanced methods for the optical quality assurance of silicon sensors

Author: Lavrik, E.; Panasenko, I; Schmidt, H. R.
Tübinger Autor(en):
Lavrik, Evgeny
Panasenko, Iaroslav
Schmidt, Hans Rudolf
Published in: Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment (2019), Bd. 922, S. 336-344
Verlagsangabe: Elsevier Science Bv
Language: English
Full text: http://dx.doi.org/10.1016/j.nima.2018.10.210
ISSN: 1872-9576
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Article
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